T/SCGS 313010-2024磁粒子成像設備激勵系統(tǒng)工作參數(shù)評價規(guī)范

ICS01.100.01

CCSJ04

團體標準

T/SCGS313010—2024

磁粒子成像設備激勵系統(tǒng)

工作參數(shù)評價規(guī)范

Specificationforevaluationofoperatingparametersof

excitationsystemsformagneticparticleimagingequipment

2024?03?11發(fā)布2024?03?11實施

中國圖學學會發(fā)布

中國標準出版社出版

T/SCGS313010—2024

目次

前言··························································································································Ⅲ

引言··························································································································Ⅳ

1范圍·······················································································································1

2規(guī)范性引用文件········································································································1

3術語和定義··············································································································1

4磁粒子成像設備激勵系統(tǒng)····························································································2

4.1磁粒子成像設備系統(tǒng)組成······················································································2

4.2磁粒子成像設備組成和各部件主要功能····································································2

4.3激勵系統(tǒng)組成及功能····························································································3

5磁粒子成像設備激勵系統(tǒng)工作參數(shù)評價指標····································································3

5.1概述·················································································································3

5.2激勵磁場均勻性指標····························································································3

5.3機械結構穩(wěn)定性指標····························································································3

5.4系統(tǒng)電力穩(wěn)定性指標····························································································4

5.5系統(tǒng)散熱效率指標·······························································································4

6檢測方法·················································································································5

6.1通用要求···········································································································5

6.2激勵磁場均勻性檢測方法······················································································5

6.3機械結構穩(wěn)定性檢測方法······················································································5

6.4系統(tǒng)電力穩(wěn)定性檢測方法······················································································5

6.5系統(tǒng)散熱效率檢測方法·························································································5

附錄A（規(guī)范性）激勵磁場均勻性檢測方法·······································································6

A.1檢測儀器··········································································································6

A.2準備測試條件·····································································································6

A.3設置掃描參數(shù)·····································································································6

A.4測試激勵磁場均勻性方法······················································································6

A.5結果表述···········································································································7

附錄B（規(guī)范性）機械結構穩(wěn)定性檢測方法········································································8

B.1制作機械結構穩(wěn)定性檢測模體················································································8

B.2準備測試條件·····································································································8

B.3設置掃描參數(shù)·····································································································8

B.4測試機械結構穩(wěn)定性····························································································8

B.5結果表述···········································································································9

Ⅰ

T/SCGS313010—2024

附錄C（規(guī)范性）系統(tǒng)電力穩(wěn)定性檢測方法······································································10

C.1檢測儀器·········································································································10

C.2準備測試條件···································································································10

C.3設置掃描參數(shù)···································································································10

C.4測試系統(tǒng)電力穩(wěn)定性··························································································10

C.5結果表述·········································································································10

附錄D（規(guī)范性）系統(tǒng)散熱效率檢測方法·········································································12

D.1檢測儀器·········································································································12

D.2準備測試條件···································································································12

D.3設置掃描參數(shù)···································································································12

D.4檢測激勵線圈散熱情況·······················································································12

D.5結果表述·········································································································13

參考文獻····················································································································14

Ⅱ

T/SCGS313010—2024

前言

本文件按照GB/T1.1—2020《標準化工作導則第1部分：標準化文件的結構和起草規(guī)則》的規(guī)

定起草。

請注意本文件的某些內(nèi)容可能涉及專利。本文件的發(fā)布機構不承擔識別專利的責任。

本文件由北京航空航天大學提出。

本文件由中國圖學學會歸口。

本文件起草單位：北京航空航天大學、中國科學院自動化研究所、中國科學院昆明動物研究所。

本文件主要起草人：安羽、李光輝、杜洋、田捷、惠輝、劉晏君、雷思奧、何杰、張博、馮欣、鐘景、牟瑋、

劉振宇、尹琳、禹曉梅、王建紅、李鴻麗。

Ⅲ

T/SCGS313010—2024

引言

磁粒子成像是新一代生物醫(yī)學成像技術，基于磁粒子作為示蹤劑，利用其非線性磁化響應信號，具

有高靈敏度、高特異性、高時空分辨率、無輻射且無成像深度限制等優(yōu)勢，在國內(nèi)外均得到了快速的發(fā)

展和應用，且已展現(xiàn)出一定的技術積累和應用潛力。目前，該技術已經(jīng)在檢測深層微小腫瘤、植介入血

管成像、在體細胞示蹤、實時動態(tài)血流監(jiān)測、腦卒中和腦損傷檢測、肺灌注成像等多領域開展預臨床研

究，被證明在臨床上具有廣泛的應用前景。

磁粒子成像設備激勵系統(tǒng)的工作參數(shù)直接決定設備工作性能，影響成像質量，最終關乎到診斷檢

查結果的準確性。磁粒子成像設備工作激勵系統(tǒng)工作參數(shù)是設備性能的核心要素，這些參數(shù)的設定直

接關系到成像質量，進一步影響診斷結果的準確性。然而磁粒子成像設備激勵系統(tǒng)的評價和規(guī)范方

面，目前尚無統(tǒng)一的標準和定量的指標。因此對磁粒子成像設備激勵系統(tǒng)工作參數(shù)進行評定和相關指

標的定量分析，形成統(tǒng)一標準，具有重要意義。

本文件制定通用要求，以規(guī)范磁粒子成像設備激勵系統(tǒng)的研發(fā)與質量評估，推動磁粒子成像技術

的高質量發(fā)展。

本文件的發(fā)布機構提請注意,聲明符合本文件時,可能涉及到專利（CN114533016B）“基于梯形波

激勵的多色定量磁納米粒子成像方法及系統(tǒng)”，（CN114521883B）“閉孔式無場線掃描磁粒子成像裝置、

系統(tǒng)及方法”，（CN115778353B）“基于旋轉諧波圖的磁場自由線磁粒子成像方法”，（CN115153490B）

“基于非旋轉場自由線的磁納米粒子檢測成像裝置、方法”，（CN117686954B）“基于振蕩梯度磁場編碼

的磁粒子成像方法及設備”，（US11,454,681B1）“Magneticparticleimagingmethodbasedonnon?ideal

fieldfreepoint”以及相關的專利的使用。

本文件的發(fā)布機構對于這些專利的真實性、有效性和范圍無任何立場。

該專利持有人已向本文件的發(fā)布機構承諾,他們愿意同任何申請人在合理且無歧視的條款和條件

下,就專利授權許可進行談判。該專利持有人的聲明在本文件的發(fā)布機構備案。相關信息可以通過以

下聯(lián)系方式獲得：

專利持有人姓名：田捷、安羽、惠輝、唐振超、李光輝、劉晏君、雷思奧、何杰、張博、張浩然、鐘景；

地址：北京市海淀區(qū)花園路街道37號北京航空航天大學學院路校區(qū)。

請注意除上述專利外，本文件的某些內(nèi)容仍可能涉及專利。本文件的發(fā)布機構不承擔識別專利的

責任。

Ⅳ

T/SCGS313010—2024

磁粒子成像設備激勵系統(tǒng)

工作參數(shù)評價規(guī)范

1范圍

本文件規(guī)定了磁粒子成像設備激勵系統(tǒng)工作參數(shù)評價指標與檢測方法。

本文件適用于永磁體、常導磁體和超導磁體磁粒子成像設備的驗收檢驗和狀態(tài)檢驗。

2規(guī)范性引用文件

下列文件中的內(nèi)容通過文中的規(guī)范性引用而構成本文件必不可少的條款。其中，注日期的引用文

件，僅該日期對應的版本適用于本文件；不注日期的引用文件，其最新版本（包括所有的修改單